Optical dispersion modelling of thin layers with multiwavelength MP-SPR
Application Note #171
Complete SPR curves before and after PEM layers measured with four wavelengths (670, 785, 850 and 980nm).
Optical dispersion is a characteristic change of refractive index of a material with wavelength. With Multi-Parametric Surface Plasmon Resonance (MP-SPR), the possibility to measure complete SPR curves at more than one wavelength allows assessment of dispersion constants to be measured of thin layers of a non-absorbing material. The more wavelengths are used, the better the estimation of the optical dispersion constants will be possible. Here optical dispersion measurement and analysis are given for poly-electrolyte multilayers (PEM).
Recommended instrument for this application
Further reading
- See also PEM layer characterization with linear (two wavelength) analysis in our AN#128.
- Do you want to see how MP-SPR instruments work? Click here
- Do you want to see MP-SPR instruments comparison? Click here
- Read also how 3 wavelength analysis was utilized to characterize lipid layers by Soler et al., 2018.