Characterization of atomic layer deposited metal films
and nanolaminates

Application Note #133

Langmuir-blodgett


SPR curves of Al2O3-Pt nanolaminates measured with MP-SPR. Each of the following four layers (Pt- Al2O3-Pt- Al2O3) added (5nm each) formed a logical series and thickness of the each layer was calculated.

Thin metal layers and nanolaminates (Pt-Al2 O3-Pt-Al2 O3 ) can be effectively characterized in terms of thickness and optical properties with Multi-Parametric Surface Plasmon Resonance (MP-SPR).

Miniaturization of optics, electronics and photovoltaics is an on-going process in todays industries. For effective application and manufacturing development is highly important that the materials can be characterized effectively. As the miniaturization is progressing more and more to the nanometer scale, the characterization techniques are pushed to the limit. There are also new phenomena available in the nanoscale, for example in hybrid nanolaminate materials, which do not have any effective characterization techniques.

Recommended instrument for this application:

200_otso_small.jpg 400_KONTIO_LOGO_24012019_cropped.jpg 210_vasa_small.jpg 410A_KAURIS_instrument.jpg  220A_naali_small.jpg 420_ilves_small.jpg
200 OTSO 400 KONTIO 210A VASA  410A KAURIS  220A NAALI 420A ILVES 
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Further reading

  • If you are interested in characterization of thin solid films, you can see also AN#146 about characterization of single and multi-layer graphene and AN#153 about characterization of metal-organic framework.

  • Do you want to see how MP-SPR instruments work? Click here.

  • Do you want to see comparison of MP-SPR instruments? Click here.

  • Here are a few publications you can have a look at.

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