Characterization of graphene oxide films with MP-SPR

Application Note #116

Langmuir-blodgett


Figure 1
. SPR curve of pure gold sensor slide as background (BG) and after two separate graphene film deposition GO1 and GO2. The dashed lines are the fitted model curves for the experiments.

Graphene oxide (GO) films were deposited with LangmuirBodgett trough on a SPR sensor slide. Two different graphene preparation methods from literature were utilized to form layers GO1 and GO2. The thickness and complex refractive index of the deposited layers were determined with Multi-Parametric Surface Plasmon Resonance (MP-SPR). Thickness of GO1 layer was 1,3 nm whereas thickness of GO2 layer was 3,6 nm showing that with GO1 method graphene formed single layer while with GO2 method graphene oxide was aggregated. Polarization modulation infrared reflection absorption spectroscopy (PM-IRRAS) was used as reference measurement and it supported MP-SPR results.

Recommended instrument for this application:

 

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200 OTSO 400 KONTIO 210A VASA  410A KAURIS  220A NAALI 420A ILVES 
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 Further reading

  • If you are interested in graphene, you may view also AN#146 about characterization of single and multi-layer graphene in air.

  • Do you want to find out how to calculate thickness out of MP-SPR measurements? Click here.

  • Do you want to see MP-SPR instruments range? Click here.

  • Here are a few publications you can have a look at.

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