Determine layer unique refractive index and thickness
with MP-SPR

Application Note #128


"Both thickness and refractive index can be determined with MP-SPR"

A sample measured at two different wavelengths provides sufficient information for unique solution of thickness and refractive index.

Multi-Parametric Surface Plasmon Resonance (MP-SPR) can be used to determine unique thickness and refractive index (RI) of ultrathin films without prior knowledge of the RI or the thickness of the layer. Polyelectrolyte multilayer was measured using MP-SPR two wavelength method and analysed by LayerSolver™ software module. Thickness of 5 bilayers was found to be 16.8nm and RI (785nm) 1.48.

Recommended instrument for this application:

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Further reading

  • If you are interested in reading more about in situ and ex situ methods and measurements, see AN#127, AN#139 and AN#150.

  • Do you want to find out how to calculate thickness out of MP-SPR measurements? Click here.
  • Do you want to see how MP-SPR instruments work? Click here.

  • Do you want to see MP-SPR instruments comparison? Click here.

  • Here are a few publications you can have a look at.


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