Why choose MP-SPR for characterization of thin solid films?

Ultrathin films from thickness of a few Ångström 

BioNavis has been involved in industrial projects where atomic layer deposition (ALD) and chemical vapor deposition (CVD) were used to produce ultrathin layers of graphene, metals and metal oxides. Resulting nanolayers from 3.5 Å (graphene) up to hundred nanometers were studied for their thickness, optical properties and plasmonics. The MP-SPR method is sensitive to metal thickness, roughness and grain structure, because these properties affect the plasmonic fingerprint that MP-SPR measures.

Thickness and refractive index solved simultaneously

Thanks to our multiple wavelength configuration with scanning angular range of almost 40 degrees, MP-SPR is capable of acquiring enough information to solve thickness and refractive index of the layer simultaneously using LayerSolver. This is possible even for nanolaminates.

The most sensitive instrument for real-time adsorption kinetics on surfaces

Owing to its plasmonic principle, MP-SPR is the most sensitive measurement for kinetics on surfaces. This is important in real-time measurements of nanoparticle adsorption kinetics, swelling and release.

From dry to wet state with the same configuration

Traditional SPR is developed to work in liquid. On the other hand, traditional ellipsometers work the best in air. MP-SPR works in both thanks to the goniometeric configuration. 

Cross-validation with microscopy and modelling is possible

MP-SPR with electrochemistry, fluorescence, or other specialty flow-cell allows for validation of measurements in-situ.

Owing to its oil-free operation, same sample can be measured ex-situ with AFM, SEM or other techniques.

Results from MP-SPR are absolute and therefore, can be directly related to physical properties and validated by established theoretical models can be confirmed also analytically.

MP-SPR measurements do not require vacuum

MP-SPR measurements can be performed at different pH, temperature (15 to 45 ºC ) and electric potential. The measurements do not require vacuum.

 


 

Recommended MP-SPR instruments for measurements of thin solid films:

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